A-A-53100
TABLE I. Sampling for examination.
|
Inspection level |
AQL (defects per hundred units) |
For visual examination |
|
|
Major defects |
II |
1.0 |
Total defects (Major and minor combined) |
II |
4.0 |
For dimensional examination |
S-1 |
2.5 |
Examination. The gloves shall be examined to determine compliance with all requirements contained in this specification.
Classification of defects. Examination shall be conducted in accordance with the classification of defects listed in table II. Examination shall not be restricted to the classified possible defects below.
TABLE II. Classification of Defects.
Classification |
Defects |
Major |
|
101 |
Gloves not sufficiently flexible to permit operation of x-ray controls. |
102 |
Gloves not free of cracks, cuts, tears, holes, perforations, or blisters. |
103 |
Gloves not a matched pair. |
104 |
Cotton glove inserts or sheaths not supplied. |
105 |
Size not as specified. |
Minor |
|
201 |
Gloves not clean and free of foreign material. |
Dimensional Examination. The gloves shall be examined for defects in dimensions. Any dimension not within the specifications herein shall be classified as a defect.
Tests.
Lead Equivalent test.
Two samples of each glove shall be radiographer at 80 KVP with intensifying screens, at an appropriate milliampere-seconds and target-film distance, using a lead step wedge. The lead equivalent of the samples shall then be determined. Failure to achieve an equivalency above the specification levels of 0.5 mm and 0.25 mm on any of the samples shall constitute a major defect.
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